DocumentCode
338068
Title
New classes of reconstruction methods in reflection mode diffraction tomography
Author
Anastasio, Mark A. ; Kupinski, Matthew A. ; Pan, Xiaochuan
Author_Institution
Dept. of Radiol., Chicago Univ., IL, USA
Volume
1
fYear
1998
fDate
1998
Firstpage
839
Abstract
Reflection mode diffraction tomography (DT) is an inversion scheme used to reconstruct the spatially variant refractive index distribution of a scattering object. We propose a linear strategy that makes use of the statistically complementary information inherent in the reflected scattered data to achieve a bias-free reduction of the image variance in two dimensional (2D) reflection mode DT. We derive infinite classes of estimation methods that can estimate the 2D Radon transform of the (band-pass filtered) scattering object function from the reflected scattered data. When the insonifying source is broadband we demonstrate that incorporation of the statistically complementary information generated by each frequency in the incident spectrum can further reduce the variance of the images reconstructed using different estimation methods
Keywords
Radon transforms; acoustic imaging; acoustic tomography; band-pass filters; image reconstruction; numerical analysis; parameter estimation; statistical analysis; ultrasonic reflection; ultrasonic scattering; 2D Radon transform; 2D reflection mode DT; band-pass filtered scattering object function; bias-free reduction; estimation methods; image variance; incident spectrum; infinite classe; insonifying source; inversion; linear strategy; reconstruction; reflected scattered data; reflection mode diffraction tomography; scattering object; spatially variant refractive index distribution; statistically complementary information; Band pass filters; Diffraction; Frequency estimation; Image reconstruction; Information filtering; Reconstruction algorithms; Reflection; Refractive index; Scattering; Tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
Conference_Location
Sendai
ISSN
1051-0117
Print_ISBN
0-7803-4095-7
Type
conf
DOI
10.1109/ULTSYM.1998.762274
Filename
762274
Link To Document