Title :
A stepwise regression approach applied to evaluation of nonlinear patterns in breathing mechanics
Author :
Cevenini, Gabriele ; Massai, Maria Rita ; Barbini, Paolo
Author_Institution :
Ist. di Chirurgia Toracica Cardiovascolare e Tecnologie Biomediche, Siena Univ., Italy
fDate :
31 Oct-3 Nov 1996
Abstract :
A multiple linear stepwise regression approach was applied to respiratory data from intensive care patients. The influence of different nonlinear viscoelastic properties on the prediction of pressure at the airway opening taken as dependent variable was studied by entering and removing potential predictive variables. These variables were derived from measured ventilatory flow data so as to quantitatively describe elastic and resistive nonlinearities attributed to typical pathophysiological mechanisms. It was found that for a better characterization of breathing mechanics, volume-dependent lung elastance must be introduced and that turbulence effects can sometimes arise. The resulting regression model still corresponds to the classical one-compartment model of breathing mechanics, but two parameters are: airflow-dependent resistance and lung volume-dependent elastance
Keywords :
lung; physiological models; pneumodynamics; statistical analysis; viscoelasticity; airflow-dependent resistance; airway opening pressure prediction; breathing mechanics; intensive care patients; mean square error; multiple linear stepwise regression approach; nonlinear patterns evaluation; nonlinear viscoelastic properties; one-compartment model; optimal regression model; pathophysiological mechanisms; predictive variables; respiratory data; turbulence effects; volume-dependent lung elastance; Biomedical measurements; Catheters; Elasticity; Immune system; Linear regression; Lungs; Mathematical model; Parameter estimation; US Department of Transportation; Viscosity;
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
DOI :
10.1109/IEMBS.1996.646550