DocumentCode
3380817
Title
Acoustic nonlinear parameter measurement in solid with a contact phase modulation method
Author
Matar, Olivier Bou ; Santos, Serge Dos ; Vila, Michel ; Vander Meulen, François
Author_Institution
GIP Ultrasons/LUSSI FRE2448, Blois, France
Volume
1
fYear
2002
fDate
8-11 Oct. 2002
Firstpage
881
Abstract
In this work, a new method to measure in contact the nonlinearity parameter β of solid plates is presented. This method is based on an idea developed by Barriere and Royer (2001) to measure the nonlinearity parameter in liquids. A high frequency (HF) tone-burst signal of 20 MHz is inserted in the material by a contact-transducer (with a suitable coupling). A low frequency (LF) pulse (2.5 MHz) is applied to the other face, in the opposite direction, such that the nonlinear interaction of the two waves takes place during the back propagation toward the HF transducer. This collinear interaction creates a phase modulation of the HF tone-burst which is directly proportional to the β coefficient and the particle velocity of the LF wave. To determine this particle velocity a self reciprocity calibration of the contact LF transducer is used, as proposed by Dace et al. (1991). A numeric phase demodulation has been performed, giving the beta coefficient of the sample. The proposed method is validated by nonlinearity parameter measurements in Fused Silica.
Keywords
acoustic measurement; nonlinear acoustics; phase modulation; silicon compounds; 2.5 MHz; 20 MHz; SiO2; acoustic nonlinear parameter measurement; back propagation; collinear interaction; contact phase modulation method; contact-transducer; fused silica; high frequency tone-burst signal; low frequency pulse; nonlinearity parameter; numeric phase demodulation; particle velocity; phase modulation; self reciprocity calibration; solid plates; Acoustic measurements; Calibration; Frequency; Hafnium; Liquids; Nonlinear acoustics; Phase measurement; Phase modulation; Solids; Transducers;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2002. Proceedings. 2002 IEEE
ISSN
1051-0117
Print_ISBN
0-7803-7582-3
Type
conf
DOI
10.1109/ULTSYM.2002.1193538
Filename
1193538
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