• DocumentCode
    3380864
  • Title

    Reliability testing beyond Qualification as a key component in photovoltaic´s progress toward grid parity

  • Author

    Wohlgemuth, John H. ; Kurtz, Sarah

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2011
  • fDate
    10-14 April 2011
  • Abstract
    This paper discusses why it is necessary for new lower cost PV modules to be tested using a reliability test sequence that goes beyond the Qualification test sequence now utilized for modules. Today most PV modules are warranted for 25 years, but the Qualification Test Sequence does not test for 25-year life. There is no accepted test protocol to validate a 25-year lifetime. This paper recommends the use of long term accelerated testing to compare now designs directly with older designs that have achieved long lifetimes in outdoor exposure. If the new designs do as well or better than the older ones, then it is likely that they will survive an equivalent length of time in the field.
  • Keywords
    power markets; reliability; solar cells; testing; PV module; photovoltaic market; qualification test sequence; reliability test sequence; IEC standards; Life estimation; Materials; Qualifications; Reliability; Stress; Testing; Grid Parity; Levelized Cost of Electricity (LCOE); Photovoltaic module reliability; Qualification Testing; Reliability Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2011 IEEE International
  • Conference_Location
    Monterey, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4244-9113-1
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2011.5784534
  • Filename
    5784534