• DocumentCode
    3381040
  • Title

    Radiation effects on strain compensated quantum dot solar cells

  • Author

    Cress, Cory D. ; Bailey, Christopher G. ; Hubbard, Seth M. ; Wilt, David M. ; Bailey, Sheila G. ; Raffaelle, Ryne P.

  • Author_Institution
    Rochester Institute of Technology, NY 14623, USA
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The effects of alpha-particle irradiation on the current-voltage characteristics and spectral responsivity of GaAs-based p-type / intrinsic / n-type solar cell devices containing 5-layers of InAs quantum dots (QD) grown with strain-compensation layers were investigated. The devices were subjected to ∼4.2 MeV alpha-particle irradiation and the variation in the air mass zero short circuit current, open circuit voltage, fill factor, efficiency, and spectral responsivity were monitored as function of fluence and displacement damage dose. The measured spectral responsivity values of the quantum dot solar cell at wavelengths above and below the GaAs bandgap were used to investigate the rate of degradation in the InAs QDs in comparison to that of bulk GaAs. A computational model was developed to study the effects of strain on the energy threshold for atomic displacement (knock-out energy) of indium and arsenic within an InAs QD. Using the many-body Tersoff potentials, the energy of the primary knock-on atom occupying various sites within the lattice was calculated as a function of strain. The observed increases in minimum knock-out energy and interstitial-site energy with strain suggest a potential mechanism for the increased radiation tolerance observed in Stranski-Krastanow grown QDs.
  • Keywords
    Capacitive sensors; Current-voltage characteristics; Gallium arsenide; Monitoring; Photovoltaic cells; Quantum dots; Radiation effects; Short circuit currents; Voltage; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922695
  • Filename
    4922695