DocumentCode
3381062
Title
RRA-based multi-objective optimization to mitigate the worst cases of placement
Author
Sheng, Yiqiang ; Takahashi, Atsushi ; Ueno, Shuichi
Author_Institution
Dept. of Commun. & Integrated Syst., Tokyo Inst. of Technol., Tokyo, Japan
fYear
2011
fDate
25-28 Oct. 2011
Firstpage
329
Lastpage
332
Abstract
As VLSI/PCB design keeps going through higher complexity, it is increasingly important to mitigate the worst cases of placement in physical design in order to get an acceptable solution within shorter runtime. This paper mainly focuses on the worst-case mitigation for multi-objective placement by using relay-race algorithm (RRA). Several intuitive advantages of RRA are discussed by comparing with simulated annealing (SA) and genetic algorithm (GA). MCNC and ami49_X benchmarks are used to test the effectiveness of RRA for placement with multiple objectives. Based on the experimental data comparing with SA, RRA obtains near 24% worst-case improvement for interconnect power consumption on average without any degradation of maximal delay. With respect to area minimization, RRA gets worst-case improvement for all tested benchmarks with near 50% runtime of SA (2X speedup).
Keywords
VLSI; benchmark testing; genetic algorithms; power consumption; printed circuit design; simulated annealing; MCNC benchmark; PCB design; RRA-based multiobjective optimization; VLSI design; ami49_X benchmark; area minimization; genetic algorithm; interconnect power consumption; multiobjective placement; physical design; relay-race algorithm; simulated annealing; worst-case mitigation; Annealing; Benchmark testing; Design automation; Runtime; CAD technique; VLSI/PCB design; multi-objective optimization; physical design; relay-race algorithm;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location
Xiamen
ISSN
2162-7541
Print_ISBN
978-1-61284-192-2
Electronic_ISBN
2162-7541
Type
conf
DOI
10.1109/ASICON.2011.6157188
Filename
6157188
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