• DocumentCode
    3381062
  • Title

    RRA-based multi-objective optimization to mitigate the worst cases of placement

  • Author

    Sheng, Yiqiang ; Takahashi, Atsushi ; Ueno, Shuichi

  • Author_Institution
    Dept. of Commun. & Integrated Syst., Tokyo Inst. of Technol., Tokyo, Japan
  • fYear
    2011
  • fDate
    25-28 Oct. 2011
  • Firstpage
    329
  • Lastpage
    332
  • Abstract
    As VLSI/PCB design keeps going through higher complexity, it is increasingly important to mitigate the worst cases of placement in physical design in order to get an acceptable solution within shorter runtime. This paper mainly focuses on the worst-case mitigation for multi-objective placement by using relay-race algorithm (RRA). Several intuitive advantages of RRA are discussed by comparing with simulated annealing (SA) and genetic algorithm (GA). MCNC and ami49_X benchmarks are used to test the effectiveness of RRA for placement with multiple objectives. Based on the experimental data comparing with SA, RRA obtains near 24% worst-case improvement for interconnect power consumption on average without any degradation of maximal delay. With respect to area minimization, RRA gets worst-case improvement for all tested benchmarks with near 50% runtime of SA (2X speedup).
  • Keywords
    VLSI; benchmark testing; genetic algorithms; power consumption; printed circuit design; simulated annealing; MCNC benchmark; PCB design; RRA-based multiobjective optimization; VLSI design; ami49_X benchmark; area minimization; genetic algorithm; interconnect power consumption; multiobjective placement; physical design; relay-race algorithm; simulated annealing; worst-case mitigation; Annealing; Benchmark testing; Design automation; Runtime; CAD technique; VLSI/PCB design; multi-objective optimization; physical design; relay-race algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2011 IEEE 9th International Conference on
  • Conference_Location
    Xiamen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-61284-192-2
  • Electronic_ISBN
    2162-7541
  • Type

    conf

  • DOI
    10.1109/ASICON.2011.6157188
  • Filename
    6157188