Title :
Design of pseudoexhaustive testable PLA with low overhead
Author :
Shen, Wen-Zen ; Hwang, Gwo-Haur ; Hsu, Wen-Jun ; Jan, Yun-Jung
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsin Chu, Taiwan
Abstract :
The pseudoexhaustive testing (PET) scheme is an economic approach to test a large embedded PLA. In this paper, the authors propose an efficient algorithm named lower overhead PET (LOPET) to partition the product lines. By applying the algorithm, both the area overhead and test length are reduced significantly
Keywords :
logic arrays; logic design; logic testing; LOPET; PET; area overhead; embedded PLA; overhead; product lines; pseudoexhaustive testable PLA; test length; Algorithm design and analysis; Built-in self-test; Circuit testing; Electronic equipment testing; Partitioning algorithms; Positron emission tomography; Programmable logic arrays; Shift registers; Test pattern generators; Very large scale integration;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1991. Proceedings of Technical Papers, 1991 International Symposium on
Conference_Location :
Taipei
Print_ISBN :
0-7803-0036-X
DOI :
10.1109/VTSA.1991.246751
