Title :
A novel MCM interconnect test technique based on resonator principles and transmission line theory
Author :
Kim, Bruce C. ; Swaminathan, Madhavan ; Chatterjee, Abhijit
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper describes a new technique for detecting and diagnosing process-related interconnect faults in MCMs. The technique uses a single-ended probe with a resonator and a waveform generator: A complete fault diagnosis is possible through measurement of magnitude and phase responses
Keywords :
fault diagnosis; integrated circuit interconnections; multichip modules; probes; resonators; transmission line theory; waveform generators; MCM interconnect test technique; fault diagnosis; phase response; process-related interconnect faults; resonator principles; single-ended probe; transmission line theory; waveform generator; Capacitance; Circuit faults; Circuit testing; Electrical fault detection; Frequency; Integrated circuit interconnections; Packaging; Probes; Transmission line theory; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1995
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-3034-X
DOI :
10.1109/EPEP.1995.524868
