A novel MCM interconnect test technique based on resonator principles and transmission line theory

Author

Kim, Bruce C. ; Swaminathan, Madhavan ; Chatterjee, Abhijit

Author_Institution

Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

fYear

1995

fDate

2-4 Oct 1995

Firstpage

117

Lastpage

119

Abstract

This paper describes a new technique for detecting and diagnosing process-related interconnect faults in MCMs. The technique uses a single-ended probe with a resonator and a waveform generator: A complete fault diagnosis is possible through measurement of magnitude and phase responses

Keywords

fault diagnosis; integrated circuit interconnections; multichip modules; probes; resonators; transmission line theory; waveform generators; MCM interconnect test technique; fault diagnosis; phase response; process-related interconnect faults; resonator principles; single-ended probe; transmission line theory; waveform generator; Capacitance; Circuit faults; Circuit testing; Electrical fault detection; Frequency; Integrated circuit interconnections; Packaging; Probes; Transmission line theory; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 1995

Conference_Location

Portland, OR

Print_ISBN

0-7803-3034-X

Type

conf

DOI

10.1109/EPEP.1995.524868

Filename

524868

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3381172