Title :
Experimental circuit modeling of coupled interconnection structures based on causality
Author :
Sercu, S. ; Martens, L.
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Belgium
Abstract :
In this paper a time-frequency domain technique for the experimental circuit modeling of coupled two-port interconnection structures and discontinuities is presented. The technique models and de-embeds each appearing discontinuity and coupled substructure of the DUT one by one, and is based on the principle of causality. To validate the accuracy of the circuit models, measured reflection, transmission, near-end and far-end crosstalk are compared with simulated results
Keywords :
crosstalk; frequency-domain analysis; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; physics fundamentals; time-frequency analysis; two-port networks; causality; circuit modeling; coupled interconnection structures; coupled substructure; far-end crosstalk; interconnection discontinuities; near-end crosstalk; reflection; time-frequency domain technique; transmission; two-port interconnection structures; Circuit testing; Coupling circuits; Crosstalk; Delay; Distributed parameter circuits; Impedance; Integrated circuit interconnections; Reflection; Time measurement; Transmission line measurements;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1995
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-3034-X
DOI :
10.1109/EPEP.1995.524869
