DocumentCode :
3381289
Title :
Compact Multilayer Piezoresistive Gauge for In-Plane Strain Measurment in Liquids
Author :
Bureau, Jean-Baptiste ; Legrand, Bernard ; Collard, Dominique ; Buchaillot, Lionel
Author_Institution :
IEMN CNRS UMR, Orsay
fYear :
2007
fDate :
10-14 June 2007
Firstpage :
2267
Lastpage :
2270
Abstract :
This paper presents an original piezoresistive strain gauge architecture based on two polysilicon layers able to sense in-plane strain. These gauges are electrically isolated from the external environment in order to be used in liquids. The presented design is based on three optimization keypoints, which one of these allows the reduction of the beam width thus leading to an increased sensitivity in force. Design, modelling, fabrication and characterization have been investigated. An in-plane sensitivity of 30 x 10-6 muN-1 has been obtained which is comparable to out of plane sensitivity, typically obtained with AFM cantilevers.
Keywords :
elemental semiconductors; multilayers; piezoelectric transducers; silicon; strain gauges; strain measurement; Si; beam width reduction; electromechanical transducer; in-plane strain measurement; multilayer piezoresistive strain gauge; polysilicon layers; Arm; Atomic force microscopy; Capacitive sensors; Force measurement; Liquids; Nonhomogeneous media; Piezoresistance; Solid state circuits; Strain measurement; Transducers; lateral detection; piezoresistivity; polysilicon; strain gauge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location :
Lyon
Print_ISBN :
1-4244-0842-3
Electronic_ISBN :
1-4244-0842-3
Type :
conf
DOI :
10.1109/SENSOR.2007.4300621
Filename :
4300621
Link To Document :
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