Title :
Diagnostic analysis of bandwidth mismatch in time-interleaved systems
Author_Institution :
NXP Semicond., Eindhoven
fDate :
Aug. 31 2008-Sept. 3 2008
Abstract :
A new approach for diagnostic analysis of bandwidth mismatch in time-interleaved systems based on gradient search method is proposed. The algorithm is adaptive to slow changes in mismatch errors and does not require any information about the input signal. Additionally, the information acquired can be re-used to supplement the circuit calibration. The proposed method is evaluated on a prototype sample-and-hold circuit fabricated in standard single poly, five metal 0.18-mum CMOS.
Keywords :
CMOS analogue integrated circuits; analogue-digital conversion; gradient methods; sample and hold circuits; search problems; CMOS; analog-to-digital converters; bandwidth mismatch; circuit calibration; diagnostic analysis; gradient search method; sample-and-hold circuit; size 0.18 mum; time-interleaved systems; Bandwidth; CMOS technology; Calibration; Circuits; Equations; Frequency conversion; Frequency estimation; Robust stability; Sampling methods; Search methods;
Conference_Titel :
Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
Conference_Location :
St. Julien´s
Print_ISBN :
978-1-4244-2181-7
Electronic_ISBN :
978-1-4244-2182-4
DOI :
10.1109/ICECS.2008.4674802
