• DocumentCode
    338138
  • Title

    Digital test program generation - overview

  • Author

    Henckels, L.P. ; Haas, R.M. ; Brown, K.M.

  • fYear
    1978
  • fDate
    1978
  • Firstpage
    28
  • Lastpage
    30
  • Keywords
    Assembly; Automatic testing; Circuit faults; Circuit testing; Dictionaries; Fault diagnosis; Large scale integration; Logic testing; Probes; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '78. International Automatic Testing Conference
  • Type

    conf

  • DOI
    10.1109/AUTEST.1978.764230
  • Filename
    764230
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=338138