DocumentCode :
338148
Title :
Dynamic testing on A. D. C. stuck fault tester
Author :
Whitley, Wayne P. ; Drinkhouse, Eric W. ; Newsom, Tom H.
Author_Institution :
IBM Corporation
fYear :
1978
fDate :
1978
Firstpage :
262
Lastpage :
264
Keywords :
Automatic logic units; Automatic testing; Circuit faults; Circuit testing; Logic testing; Microprocessors; Pins; Power system modeling; Sequential circuits; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
Type :
conf
DOI :
10.1109/AUTEST.1978.764377
Filename :
764377
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=338148
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