Title :
Integrated polarization-analyzing CMOS image sensor
Author :
Sarkar, Mukul ; Bello, David San Segundo ; Van Hoof, Chris ; Theuwissen, Albert
Author_Institution :
IMEC, Leuven, Belgium
fDate :
May 30 2010-June 2 2010
Abstract :
A CMOS image sensor with an integrated wire grid polarizer to sense the polarization of light is presented. The chip consists of an array of 128 by 128 pixels, it occupies an area of 5×4 mm2 and it has been designed and fabricated in a CMOS 180nm process. Extinction ratio of 6.3 and 7.7 were achieved. The sensor is used to classify materials based on the degree of polarization and the transmitted intensity after specular reflection on the material surface. The variation in the transmitted intensity among dielectrics and metals was successfully demonstrated.
Keywords :
CMOS image sensors; light polarisation; CMOS process; integrated polarization-analyzing CMOS image sensor; integrated wire grid polarizer; material surface; specular reflection; transmitted intensity; CMOS image sensors; CMOS technology; Dielectric materials; Extinction ratio; Filters; Image sensors; Optical polarization; Optical reflection; Sensor arrays; Wire;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537516
