Title :
An approach to ate/uut functional matching
Author :
Granieri, Michael ; Paffenroth, Gary ; Ransom, Diane ; Schmitt, William
Author_Institution :
ManTech of New Jersey Corporation
Keywords :
Automatic test equipment; Circuit testing; Hardware; Histograms; Large-scale systems; Manufacturing; Radio frequency; System testing; Test equipment; Weapons;
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
DOI :
10.1109/AUTEST.1978.764394
