Title :
Design of a rad-hard library of digital cells for space applications
Author :
Stabile, Alberto ; Liberali, Valentino ; Calligaro, Cristiano
Author_Institution :
Dept. of Inf. Technol., Univ. of Milano, Crema
fDate :
Aug. 31 2008-Sept. 3 2008
Abstract :
This paper proposes a design methodology for a digital library of cells resistant to cosmic radiation. Most important effects due to radiation are avoided or mitigated using ad hoc design techniques. Fault injection techniques are used to validate the design. Simulations results demonstrate that the cells designed in a 180 nm CMOS technology are tolerant to 1.5 mA current peak due to interaction with a single high-energy particle.
Keywords :
CMOS digital integrated circuits; cosmic background radiation; logic design; logic gates; radiation effects; CMOS technology; cosmic radiation; current 1.5 mA; digital cells; fault injection; logic gates; rad-hard library; size 180 nm; Charge carrier processes; Circuit faults; Circuit simulation; Design methodology; Electron traps; Radiation hardening; Single event upset; Software libraries; Space technology; Threshold voltage;
Conference_Titel :
Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
Conference_Location :
St. Julien´s
Print_ISBN :
978-1-4244-2181-7
Electronic_ISBN :
978-1-4244-2182-4
DOI :
10.1109/ICECS.2008.4674813