• DocumentCode
    3381594
  • Title

    Effect of package shape on spurious coupling among microstrip discontinuities

  • Author

    Gupta, K.C. ; Cebi, Haki ; Thng, Cheok

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
  • fYear
    1995
  • fDate
    2-4 Oct 1995
  • Firstpage
    184
  • Lastpage
    187
  • Abstract
    Effects of a metallic package on the performance of a microstrip circuit are attributed mainly to the modifications of spurious couplings among various discontinuities. This paper describes a method for computing the effect of the package shape on the interactions among discontinuities
  • Keywords
    MMIC; integrated circuit design; integrated circuit packaging; microstrip circuits; microstrip discontinuities; MMICs; metallic package; microstrip circuit; microstrip discontinuities; package shape; spurious coupling; Coupling circuits; Current distribution; Design engineering; Electromagnetic fields; Magnetic circuits; Magnetic separation; Microstrip; Packaging; Shape; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 1995
  • Conference_Location
    Portland, OR
  • Print_ISBN
    0-7803-3034-X
  • Type

    conf

  • DOI
    10.1109/EPEP.1995.524890
  • Filename
    524890