• DocumentCode
    3381782
  • Title

    A time-domain flash ADC immune to voltage controlled delay line non-linearity

  • Author

    Kim, Young-Hwa ; Cho, SeongHwan

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2011
  • fDate
    25-28 Oct. 2011
  • Firstpage
    469
  • Lastpage
    471
  • Abstract
    A Flash analog-to-digital converter (ADC) architecture operating in time-domain is presented. The proposed ADC uses voltage controlled delay lines (VCDLs) and time-domain comparators instead of pre-amplifiers and voltage-domain comparators in the conventional Flash ADC. Due to the time-domain operation, the proposed Flash ADC benefits from fast switching speed of advanced CMOS process. A key property of the proposed ADC is that its linearity is not affected by the non-linearity of the VCDL, due to the identical VCDLs that are used in both the input signal and reference voltages.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; comparators (circuits); delay lines; voltage control; advanced CMOS process; analog-to-digital converter; time-domain comparators; time-domain flash ADC immune; voltage controlled delay line nonlinearity; voltage-domain comparators; Logic gates; Service oriented architecture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2011 IEEE 9th International Conference on
  • Conference_Location
    Xiamen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-61284-192-2
  • Electronic_ISBN
    2162-7541
  • Type

    conf

  • DOI
    10.1109/ASICON.2011.6157223
  • Filename
    6157223