Title : 
New calibration technique for current-steering DACs
         
        
            Author : 
Tao Zeng ; Degang Chen
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
         
        
        
            fDate : 
May 30 2010-June 2 2010
         
        
        
        
            Abstract : 
Attaining high matching property of the current sources is very important for the design of high-speed high-accuracy current-steering DACs. This paper presents a novel calibration technique-complete-folding, which achieves the high matching accuracy by selectively regrouping current sources into a fully binary-weighted array based on the current comparisons after chip fabrication. The implementation only requires an analog current comparator and some digital circuitry. The minimum requirement of analog circuits makes the complete-folding calibration suitable for the DAC design in the low-voltage process. Statistical results with a behavioral model of a 14-bit segmented DAC in MATLAB show that complete-folding calibration can reduce the total gate area of current sources by a factor of almost 1200 compared to that using intrinsic-accuracy method. Additional results also show that the new calibration technique has the superior performance in compensating random mismatch errors compared with state-of-the-art.
         
        
            Keywords : 
calibration; digital-analogue conversion; high-speed integrated circuits; mathematics computing; MATLAB; analog circuits; analog current comparator; calibration technique-complete-folding; chip fabrication; digital circuitry; high-speed high-accuracy current-steering DAC; word length 14 bit; Analog circuits; CMOS process; CMOS technology; Calibration; Chip scale packaging; Degradation; MATLAB; Mathematical model; Power supplies; USA Councils;
         
        
        
        
            Conference_Titel : 
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
         
        
            Conference_Location : 
Paris
         
        
            Print_ISBN : 
978-1-4244-5308-5
         
        
        
            DOI : 
10.1109/ISCAS.2010.5537534