Title :
Experimental measurement of the scattering patterns of resistive sheets
Author :
Haupt, R.L. ; Liepa, V.V.
Author_Institution :
Dept. of Electr. Eng., US Air Force Acad., Colorado Springs, CO, USA
Abstract :
The authors present theoretical and experimental bistatic scattering and backscattering results from a tapered resistive sheet. It is shown that it is possible to lower the bistatic scattering and backscattering sidelobe levels of a resistive sheet by tapering the resistivity. The experimental and theoretical results shown some disagreement in the low sidelobe region because of errors in the resistive taper, experimental errors, the return from the styrofoam mount, and the joining of the two tapered sheets to form a symmetrically tapered sheet.<>
Keywords :
backscatter; electromagnetic wave scattering; EM wave scattering; backscattering; bistatic scattering; scattering patterns; sidelobe levels; tapered resistive sheet; Backscatter; Coatings; Conductivity; Dielectric substrates; Frequency measurement; Indium tin oxide; Laboratories; Scattering; Springs; Strips;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1988. AP-S. Digest
Conference_Location :
Syracuse, NY, USA
DOI :
10.1109/APS.1988.94366
