DocumentCode
3382001
Title
Experimental measurement of the scattering patterns of resistive sheets
Author
Haupt, R.L. ; Liepa, V.V.
Author_Institution
Dept. of Electr. Eng., US Air Force Acad., Colorado Springs, CO, USA
fYear
1988
fDate
6-10 June 1988
Firstpage
1408
Abstract
The authors present theoretical and experimental bistatic scattering and backscattering results from a tapered resistive sheet. It is shown that it is possible to lower the bistatic scattering and backscattering sidelobe levels of a resistive sheet by tapering the resistivity. The experimental and theoretical results shown some disagreement in the low sidelobe region because of errors in the resistive taper, experimental errors, the return from the styrofoam mount, and the joining of the two tapered sheets to form a symmetrically tapered sheet.<>
Keywords
backscatter; electromagnetic wave scattering; EM wave scattering; backscattering; bistatic scattering; scattering patterns; sidelobe levels; tapered resistive sheet; Backscatter; Coatings; Conductivity; Dielectric substrates; Frequency measurement; Indium tin oxide; Laboratories; Scattering; Springs; Strips;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1988. AP-S. Digest
Conference_Location
Syracuse, NY, USA
Type
conf
DOI
10.1109/APS.1988.94366
Filename
94366
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