• DocumentCode
    3382073
  • Title

    A model for energy quantization of single-electron transistor below 10nm

  • Author

    Chen, Xiaobao ; Xing, Zuocheng ; Sui, Bingcai

  • Author_Institution
    Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
  • fYear
    2011
  • fDate
    25-28 Oct. 2011
  • Firstpage
    531
  • Lastpage
    534
  • Abstract
    Single-electronic transistor (SET) are considered as the attractive candidates for post-COMS VLSI due to their ultra-small size and low power consumption. Along with the size of coulomb island become smaller and smaller, the energy quantization of single electron transistor based on charge state come forth and from obviously to more obviously. A qualitative analysis to single-electron transistors base on charge state with discrete energy levels, is introduced in this paper. Compared with other analysis to single-electron transistor based on charge state without discrete energy levels, our result is close to fact. Through the comparison, it can be get that the former is accurate and close to fact compared with the simulator without discrete energy levels, and is very useful for the ASIC design of SET devices.
  • Keywords
    Coulomb blockade; semiconductor device models; single electron transistors; ASIC design; Coulomb island; SET device; discrete energy level; energy quantization; post-COMS VLSI; single-electron transistor; Analytical models; Logic gates; Energy quantization; discrete energy levels; orthodox theory; single electron transistor (SET);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2011 IEEE 9th International Conference on
  • Conference_Location
    Xiamen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-61284-192-2
  • Electronic_ISBN
    2162-7541
  • Type

    conf

  • DOI
    10.1109/ASICON.2011.6157239
  • Filename
    6157239