In-Situ TEM Observation of Crystal-Facet-Dependent Self-Rearranging Gold Atoms Under Tensile Stress Controlled by MEMS Nanoprobe Positioner

Author

Ishida, Tadashi ; Kakushima, Kuniyuki ; Mita, Makoto ; Toshiyoshi, Hiroshi ; Fujita, Hiroyuki

Author_Institution

Univ. of Tokyo, Tokyo

fYear

2007

fDate

10-14 June 2007

Firstpage

2505

Lastpage

2508

Abstract

We have newly observed the gold atom migration and rearrangement at the artificially made point contact in a well controlled manner using microactuated probes with nano positioning accuracy. In-situ TEM observation revealed that the initial gold facet before contact strongly influences the shape of a nanobridge during the tensile test. Crystallographic facets of (211 macr), (101 macr) and (110 macr) at the nanocontact correspond to the formation of an inhomogeneous nanowire, a thinned nanocontact, and a homogeneous nano-contact, respectively.

Keywords

crystallography; micromechanical devices; probes; transmission electron microscopy; MEMS nanoprobe positioner; TEM; crystal-facet-dependent self-rearranging gold atoms; crystallographic facets; gold atom migration; inhomogeneous nanowire; microactuated probes; tensile stress; thinned nanocontact; Electrodes; Etching; Gold; Micromechanical devices; Probes; Shape; Silicon; Stress control; Tensile stress; Transmission electron microscopy; Gold Nanocontact; MEMS Opposing Tips; Self Rearrangement; Transmission Electron Microscope;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International

Conference_Location

Lyon

Print_ISBN

1-4244-0842-3

Electronic_ISBN

1-4244-0842-3

Type

conf

DOI

10.1109/SENSOR.2007.4300680

Filename

4300680