Title :
A parameterized microwave model for short vegetation layer
Author :
Chai, L. ; Shi, J. ; Zhang, L. ; Jiang, L.
Author_Institution :
State Key Lab. of Remote Sensing Sci., Beijing Normal Univ., Beijing, China
Abstract :
Vegetation is the most important part of the terrestrial ecosystems which results in a large proportion of studies on vegetation parameters, such as coverage, biomass, water content and so on. Since the ultimate goal of remote sensing is to accurately and efficiently inverse land surface parameters, it is of great significance to find a good forward vegetation model with simple form and high accuracy for the inversion. Though the zeroth-order model is good for fast inversion with its simple form, it always underestimates the total emission at high frequency or for dense vegetation. The first-order model has higher accuracy due to the consideration of volume scattering contribution, but it is complex and computationally intensive. In this regard, we developed a parameterized model base on emissivity simulations from the first-order model for short vegetation covered ground in this paper. This parameterized model takes a similar form as that of the zeroth-order model. It is of great significance for accurate and efficient inversion.
Keywords :
emissivity; geophysical signal processing; inverse problems; microwave measurement; remote sensing; vegetation; emissivity simulations; first order model; forward vegetation model; land surface parameter inversion; parameterized microwave model; remote sensing; short vegetation covered ground; short vegetation layer; terrestrial ecosystems; vegetation biomass; vegetation coverage; vegetation parameters; vegetation water content; Biological system modeling; Computational modeling; Mathematical model; Microwave radiometry; Remote sensing; Scattering; Vegetation; first-order radiative transfer solution; parameterized model; passive microwave; volume scattering;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2010.5654450