• DocumentCode
    3382567
  • Title

    Application of Parameter Extraction Techniques for Impedance Spectroscopy

  • Author

    Kanoun, Olfa ; Tröltzsch, Uwe

  • Author_Institution
    Inst. for Meas. & Autom., Bundeswehr Munich Univ., Neubiberg
  • Volume
    3
  • fYear
    2005
  • fDate
    16-19 May 2005
  • Firstpage
    2281
  • Lastpage
    2286
  • Abstract
    The more effects and mechanisms are represented in an impedance spectrum, the more unknown parameters are needed for an accurate modeling. The parameter extraction process becomes thereby more difficult to solve and needs a lot of trials and a priori knowledge. Some sophisticated optimization techniques were investigated at models with different complexity levels in order to increase efficiency during this process. For simple models evolution strategy seems to be nearly insensitive to the chosen search region. For models with a large number of unknown parameters, a combination of evolution strategy with the Levenberg-Marquardt (LevMq) method reaches very good results compared with each method alone. This hybrid solution profited also from different sensitivities of both methods and allowed a better handling of difficult inverse identification problems. The resulting process is robust and reaches good modeling results even, if only a few a priori knowledge is available concerning expected parameter values
  • Keywords
    electrochemical impedance spectroscopy; inverse problems; parameter estimation; LevMq method; Levenberg-Marquardt method; complexity levels; evolution strategy; impedance spectroscopy; inverse identification problems; optimization techniques; parameter extraction techniques; Automation; Electrochemical impedance spectroscopy; Evolution (biology); Frequency measurement; Impedance measurement; Least squares methods; Newton method; Parameter extraction; Recursive estimation; Robustness; evolutionary strategy; impedance spectroscopy; inverse problem; parameter extraction; sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
  • Conference_Location
    Ottawa, Ont.
  • Print_ISBN
    0-7803-8879-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2005.1604583
  • Filename
    1604583