DocumentCode :
3382803
Title :
A robust FIR filter with in situ error detection
Author :
Whatmough, Paul N. ; Darwazeh, Izzat ; Bull, David M. ; Das, Shidhartha ; Kershaw, Danny
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. Coll. London, London, UK
fYear :
2010
fDate :
May 30 2010-June 2 2010
Firstpage :
4185
Lastpage :
4188
Abstract :
We propose a novel FIR filter architecture that mitigates sub-critical timing violations as they occur in the pipeline structure by momentarily bypassing affected coefficients. Timing violations are detected using known in situ circuit-level techniques based on late transition detection at timing end points. The approach enables operation with a small but non-zero logical error rate, such that process, voltage and temperature margins can be eliminated without compromising stop-band attenuation. The proposed architecture is implemented in a 90nm CMOS process technology using a typical commercial standard cell implementation flow and verified using full model SPICE simulations. The filter operates at a maximum clock frequency of 420 MHz at 1 V, with an estimated area and power overhead of 26% and 24% respectively compared to a conventional implementation. At the typical process and temperature corner, the proposed architecture can be scaled in voltage down to the point of first failure at 730 mV, thereby achieving a 53% power saving, with no detectable degradation in stop-band attenuation characteristics.
Keywords :
CMOS digital integrated circuits; FIR filters; band-stop filters; pipeline processing; semiconductor device reliability; CMOS process technology; SPICE simulation; in situ error detection; non zero logical error rate; pipeline structure; robust FIR filter; size 90 nm; standard cell; stop band attenuation; timing violation; voltage 1 V; Attenuation; Circuits; Error analysis; Finite impulse response filter; Frequency estimation; Pipelines; Robustness; Temperature; Timing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
Type :
conf
DOI :
10.1109/ISCAS.2010.5537581
Filename :
5537581
Link To Document :
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