Title :
Single Fault Models for Timed FSMs
Author :
Uyar, M. Ümit ; Wang, Yu ; Batth, Samrat S. ; Wise, Adriana ; Fecko, Mariusz A.
Author_Institution :
Dept. of Electr. Eng., New York Univ.
Abstract :
The classification and detection of single timing faults in timed FSMs are introduced. A graph augmentation method is used to formulate the detection models for timing faults. It is shown that, by using our graph augmentation models, a faulty IUT ends up in a different state than the intended one, hence, enabling the detection of these single timing faults
Keywords :
conformance testing; fault diagnosis; finite state machines; graph theory; fault detection; graph augmentation method; single fault models; single timing faults; timed FSM; Automata; Automatic testing; Cities and towns; Computer science; Costs; Educational institutions; Fault detection; Protocols; Timing; Upper bound; Conformance Testing; Fault Modeling; Simple Faults; Timed Automata; Timer Constraints;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604598
