DocumentCode :
3382840
Title :
A simulation study of vertical tunnel field effect transistors
Author :
Han, Zhong-Fang ; Ru, Guo-Ping ; Ruan, Gang
Author_Institution :
Dept. of Microelectron., Fudan Univ., Shanghai, China
fYear :
2011
fDate :
25-28 Oct. 2011
Firstpage :
665
Lastpage :
668
Abstract :
We report a simulation study of the characteristics of a new tunnel field effect transistor (TFET), i.e., vertical TFET (VTFET). The new VTFET has a different working principle compared with the traditional lateral TFET (LTFET), which most of the recent studies are focused on. Although both type TFETs are based on band to band tunneling, the tunneling occurs perpendicular to the oxide-Si interface in the VTFET whereas it occurs parallel in LTFET. The VTFET has many advantages compared with the LTFET, such as a steeper subthreshold slope as the gate voltage control the tunneling directly. The steep subthreshold slope results in low OFF current and capability for low power operation.
Keywords :
field effect transistors; low-power electronics; semiconductor device models; tunnel transistors; tunnelling; voltage control; LTFET; VTFET; band to band tunneling; gate voltage control; lateral TFET; low OFF current; low power operation; oxide-silicon interface; simulation study; steeper subthreshold slope; vertical TFET; vertical tunnel field effect transistors; working principle; Immune system; Logic gates; MOSFET circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location :
Xiamen
ISSN :
2162-7541
Print_ISBN :
978-1-61284-192-2
Electronic_ISBN :
2162-7541
Type :
conf
DOI :
10.1109/ASICON.2011.6157293
Filename :
6157293
Link To Document :
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