• DocumentCode
    3382972
  • Title

    Immersion of silicon solar cells in an oxidation solution

  • Author

    Lin, Ching-Hsi ; Huang, Chien-Rong ; Dimitrov, Dimitre Z. ; Du, Chen-Hsun ; Sun, Wen-Ching

  • Author_Institution
    Photovoltaics Technology Center, Industrial Technology Research Institute, Rm.402, Bldg.78, 195, Sec.4, Chung Hsing Rd., Chutung, Hsinchu, Taiwan 310
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The conventional wafer-type crystalline silicon solar cells have an approximately 80nm thick top SiNx coating which acts as an anti-reflection layer. The SiNx layer also passivates the silicon substrate surface to reduce free electron consumption very near the surface. Besides, it was known that the properties of the SiNx layer itself may, to some extent, affect the performance of the solar cell. The purpose of this study is to provide a low-temperature method that will help to modify the properties of the SiNx film, especially for low-temperature grown SiNx thin layer. This is achieved by immersing the finished silicon solar cells into an oxidation solution containing strong oxidant. Oxidation solution helps to oxidize the low-temperature grown SiNx as well as the weakly passivated silicon surface. By applying the techniques, the properties of the SiNx layer have been modified and an enhancement on cell performance was demonstrated. The results presented in this study show that the properties of the SiNx layer need to be taken with care, because they may affect the performance of the solar cells.
  • Keywords
    Abstracts; Coatings; Crystallization; Etching; Oxidation; Passivation; Photovoltaic cells; Silicon compounds; Sun; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922789
  • Filename
    4922789