Title :
Novel concepts for high voltage junction termination techniques using very deep trenches
Author :
Dragomirescu, D. ; Charitat, G. ; Morancho, F. ; Rossel, P.
Author_Institution :
Lab. d´´Autom. et d´´Anal. des Syst., CNRS, Toulouse, France
Abstract :
Numerous techniques have been used to improve the voltage handling capability of high voltage power devices with the aim to obtain the breakdown of a plane junction. In this work, we present a new high voltage junction termination technique using very deep trenches available from microsystems technologies. This new concept names Trench Termination Technique: T3 increase the device breakdown voltage to almost the ideal value of the plane case and, in the same time, consume a much lower Silicon space than the previous proposed solutions as an example. Two different architectures for 6 kV devices are described, but these techniques are easily scalable to any voltage range (in the field of high voltage devices)
Keywords :
power semiconductor devices; semiconductor device breakdown; semiconductor junctions; semiconductor technology; 6 kV; Si; breakdown voltage; high voltage power device; junction termination extension; microsystem technology; trench termination technique; Anodes; Breakdown voltage; Diffusion processes; Doping; Etching; Low voltage; Protection; Silicon; Space charge; Space technology;
Conference_Titel :
Semiconductor Conference, 1999. CAS '99 Proceedings. 1999 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-5139-8
DOI :
10.1109/SMICND.1999.810432