DocumentCode :
3383407
Title :
Computer Aided-Program for Validation of Measuring System from Unit Step Response by Time Convolution Method
Author :
Yutthagowith, P. ; Pattanadech, N. ; Kunakorn, A. ; Phoomvuthisarn, S.
Author_Institution :
Center of Excellence in Electr. Power Technol., Chulalongkorn Univ., Bangkok
fYear :
2005
fDate :
21-24 Nov. 2005
Firstpage :
1
Lastpage :
6
Abstract :
This paper presents the design and development of the computer algorithm based on LabVIEW for verification of a high voltage measuring system. The algorithm consists of two parts. The first part is a program for calculating the parameters of unit step responses which are verified an ability of the measuring system by a comparison with the values given in IEC 60060-2. The second part is a program for calculating the output voltage waveform by time convolutions between standard testing waveforms and unit step responses. The standard waveforms under investigation are full lightning impulse voltage waveforms, tail-chopped lightning impulse voltage waveforms, front-chopped lightning impulse voltage waveforms and steep-front voltage waveforms according to IEC standards 60060-2 and 61211. This paper considers two different types of the measuring systems, with a resistive voltage divider and a damped capacitive voltage divider for testings. The results show that the algorithm proposed in this paper is practicable, and should be a useful tool for impulse voltage measurements in a standard high voltage laboratory.
Keywords :
IEC standards; computerised instrumentation; measurement standards; measurement systems; power engineering computing; voltage measurement; IEC 60060-2; IEC 61211; LabVIEW; computer aided-program; damped capacitive voltage divider; front-chopped lightning impulse voltage waveforms; full lightning impulse voltage waveforms; high voltage measuring system; output voltage waveform; resistive voltage divider; steep-front voltage waveforms; tail-chopped lightning impulse voltage waveforms; time convolution method; unit step response; Algorithm design and analysis; Convolution; IEC standards; Lightning; Measurement standards; Measurement units; System testing; Time factors; Time measurement; Voltage measurement; computer aided-program; convolutions; impulse voltage measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2005 2005 IEEE Region 10
Conference_Location :
Melbourne, Qld.
Print_ISBN :
0-7803-9311-2
Electronic_ISBN :
0-7803-9312-0
Type :
conf
DOI :
10.1109/TENCON.2005.301020
Filename :
4085246
Link To Document :
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