DocumentCode :
3383506
Title :
Environmental testing of elastomeric connectors
Author :
Tunca, Necla ; Rose, Georg
Author_Institution :
Digital Equipment of Canada Ltd., Kanata, Ont., Canada
fYear :
1992
fDate :
18-21 Oct. 1992
Firstpage :
249
Lastpage :
255
Abstract :
The electrical performance of metal-in-elastometer connectors is evaluated for chip-on-board applications. Flowing mixed gas (FMG) class-II corrosion and dust tests are performed in accelerated conditions to simulate the long-term operating life of connectors in office-type environments. To explore the functional limits, the connectors are also tested in FMG class-III conditions, which simulate industrial environments. The parameters, low-level contact resistance (LLCR) and surface insulation resistance (SIR) leakage current, are monitored throughout the test to assess electrical stability. Special requirements for the printed circuit boards used in applications with metal-in-elastometer connectors are identified by metallurgical analysis after the corrosion tests. The test results show that the elastometer connectors are viable interconnect media in corrosion and dust environments. Good electrical performance (long-term stability) is attributed to the gasket-like sealing properties of the high density separable connectors.<>
Keywords :
contact resistance; corrosion testing; elastomers; electric connectors; environmental testing; leakage currents; life testing; printed circuit accessories; FMG class-III conditions; LLCR; SIR; accelerated testing; chip-on-board applications; dust tests; electrical performance; electrical stability; environmental testing; flowing mixed gas class II corrosion test; gasket-like sealing properties; high density separable connectors; industrial environments; interconnect media; leakage current; long term operating life simulation; long-term stability; low-level contact resistance; metal-in-elastometer connectors; metallurgical analysis; office-type environments; printed circuit boards; surface insulation resistance; Circuit simulation; Circuit stability; Circuit testing; Connectors; Contact resistance; Corrosion; Life estimation; Life testing; Performance evaluation; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1992., Proceedings of the Thirty-Eighth IEEE Holm Conference on
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-0576-0
Type :
conf
DOI :
10.1109/HOLM.1992.246909
Filename :
246909
Link To Document :
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