DocumentCode
3383561
Title
Study of ion implanted arcing contacts
Author
Qiaogen, Zhang ; Shiru, Xu ; Chengfen, Qiu ; Guoqiang, Xie
Author_Institution
Dept. of Electron. Eng., Xi´´an Jiaotong Univ., Shaanxi, China
fYear
1992
fDate
18-21 Oct. 1992
Firstpage
213
Lastpage
218
Abstract
The study of arc on break is a useful tool for finding an optimum implanting technology to increase the reliability and lifetime of contacts. Argon ions or boron ions were implanted into AgMgNi contact material, and arc duration and erosion were measured. The results show that the arc duration and erosion are reduced as compared to unimplanted contacts. It is found that the ion implanted contacts have fast voltage transition from a metallic to a gaseous phase in break arcs. Auger and X-ray diffraction analysis show that the surfaces of ion implanted contacts have formed supersaturated solid solution and smaller crystalline grains which may affect the electrical properties of the contacts.<>
Keywords
Auger effect; X-ray diffraction examination of materials; argon; bosons; circuit-breaking arcs; electrical contacts; ion implantation; magnesium alloys; nickel alloys; silver alloys; AgMgNi:Ar; AgMgNi:B; Auger analysis; X-ray diffraction analysis; arc duration; contact lifetime; contact reliability; crystalline grains; erosion; ion implanted arcing contacts; optimum implanting technology; supersaturated solid solution; voltage transition; Argon; Boron; Contacts; Instruments; Ion implantation; Production facilities; Surface treatment; Temperature; Voltage; Welding;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 1992., Proceedings of the Thirty-Eighth IEEE Holm Conference on
Conference_Location
Philadelphia, PA, USA
Print_ISBN
0-7803-0576-0
Type
conf
DOI
10.1109/HOLM.1992.246912
Filename
246912
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