• DocumentCode
    3383561
  • Title

    Study of ion implanted arcing contacts

  • Author

    Qiaogen, Zhang ; Shiru, Xu ; Chengfen, Qiu ; Guoqiang, Xie

  • Author_Institution
    Dept. of Electron. Eng., Xi´´an Jiaotong Univ., Shaanxi, China
  • fYear
    1992
  • fDate
    18-21 Oct. 1992
  • Firstpage
    213
  • Lastpage
    218
  • Abstract
    The study of arc on break is a useful tool for finding an optimum implanting technology to increase the reliability and lifetime of contacts. Argon ions or boron ions were implanted into AgMgNi contact material, and arc duration and erosion were measured. The results show that the arc duration and erosion are reduced as compared to unimplanted contacts. It is found that the ion implanted contacts have fast voltage transition from a metallic to a gaseous phase in break arcs. Auger and X-ray diffraction analysis show that the surfaces of ion implanted contacts have formed supersaturated solid solution and smaller crystalline grains which may affect the electrical properties of the contacts.<>
  • Keywords
    Auger effect; X-ray diffraction examination of materials; argon; bosons; circuit-breaking arcs; electrical contacts; ion implantation; magnesium alloys; nickel alloys; silver alloys; AgMgNi:Ar; AgMgNi:B; Auger analysis; X-ray diffraction analysis; arc duration; contact lifetime; contact reliability; crystalline grains; erosion; ion implanted arcing contacts; optimum implanting technology; supersaturated solid solution; voltage transition; Argon; Boron; Contacts; Instruments; Ion implantation; Production facilities; Surface treatment; Temperature; Voltage; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1992., Proceedings of the Thirty-Eighth IEEE Holm Conference on
  • Conference_Location
    Philadelphia, PA, USA
  • Print_ISBN
    0-7803-0576-0
  • Type

    conf

  • DOI
    10.1109/HOLM.1992.246912
  • Filename
    246912