DocumentCode :
3383561
Title :
Study of ion implanted arcing contacts
Author :
Qiaogen, Zhang ; Shiru, Xu ; Chengfen, Qiu ; Guoqiang, Xie
Author_Institution :
Dept. of Electron. Eng., Xi´´an Jiaotong Univ., Shaanxi, China
fYear :
1992
fDate :
18-21 Oct. 1992
Firstpage :
213
Lastpage :
218
Abstract :
The study of arc on break is a useful tool for finding an optimum implanting technology to increase the reliability and lifetime of contacts. Argon ions or boron ions were implanted into AgMgNi contact material, and arc duration and erosion were measured. The results show that the arc duration and erosion are reduced as compared to unimplanted contacts. It is found that the ion implanted contacts have fast voltage transition from a metallic to a gaseous phase in break arcs. Auger and X-ray diffraction analysis show that the surfaces of ion implanted contacts have formed supersaturated solid solution and smaller crystalline grains which may affect the electrical properties of the contacts.<>
Keywords :
Auger effect; X-ray diffraction examination of materials; argon; bosons; circuit-breaking arcs; electrical contacts; ion implantation; magnesium alloys; nickel alloys; silver alloys; AgMgNi:Ar; AgMgNi:B; Auger analysis; X-ray diffraction analysis; arc duration; contact lifetime; contact reliability; crystalline grains; erosion; ion implanted arcing contacts; optimum implanting technology; supersaturated solid solution; voltage transition; Argon; Boron; Contacts; Instruments; Ion implantation; Production facilities; Surface treatment; Temperature; Voltage; Welding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1992., Proceedings of the Thirty-Eighth IEEE Holm Conference on
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-0576-0
Type :
conf
DOI :
10.1109/HOLM.1992.246912
Filename :
246912
Link To Document :
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