Title :
Digital switching systems reliability.- the tropico approach and field results
Author :
Hugueney, C., Jr. ; Saraiva, S.P. ; Nunes, G.
Author_Institution :
PHT Sistemas Eletronicos, Ltda
Keywords :
Centralized control; Circuit faults; Control systems; Digital control; Distributed control; Manufacturing; Microprocessors; Research and development; Switching systems; Telephony;
Conference_Titel :
Switching Symposium, 1990. XIII International
DOI :
10.1109/ISS.1990.765814
