• DocumentCode
    3383894
  • Title

    Fabrication and characterization of CdS/CIS nanowire heterojunctions

  • Author

    Singh, Vijay P. ; Rajaputra, Suresh ; Liu, Piao ; Phok, Sovannary ; Guduru, Sai

  • Author_Institution
    Center for Nanoscale Science & Engineering, Department of Electrical & Computer Engineering, University of Kentucky, Lexington, 40506 USA
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Nanowire arrays of CIS were formed inside porous alumina templates by pulsed potential electrodeposition. Close to stoichiometric CIS phase in a chalcopyrite crystal structure with a = 5.782 Å and c = 11.619 Å. was obtained. Atomic weight fractions of Cu, In and Se were 20%:38%:42%. Arrays of cadmium sulfide nanowire were also fabricated inside the porous AAO templates. The XRD pattern of the CdS nanowires indicated the hexagonal lattice with the dominant crystal planes of <100>, <002> and <101>. The absorption spectrum of as-prepared CdS nanowires showed the blue shift of the absorption edge from the bulk crystal value of 515 nm to 490 nm. Al/CIS and Au/CdS Nanowire Schottky diodes were fabricated and their electrical properties were investigated. Diode analysis on the Au/CdS device reveled that the values of the effective diode ideality factor (A) and the effective reverse saturation current (J0,), were, 8.0 and 0.32 mA/cm2 in the dark, and 9.9 and 0.9 mA/cm2 under illumination. The fact that the measured values of effective diode ideality factor (A) were larger than 2.0 indicates that the dominant mechanism of electron transport across the junction is likely to be tunneling and/or interface state recombination, or a combination of these two.
  • Keywords
    Absorption; Cadmium compounds; Computational Intelligence Society; Fabrication; Gold; Heterojunctions; Lattices; Lighting; Schottky diodes; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922834
  • Filename
    4922834