Title :
A design procedure of predictive RF MOSFET model for compatibility with ITRS
Author :
Kim, SinNyoung ; Tsuchiya, Akira ; Onodera, Hidetoshi
Author_Institution :
Dept. Commun. & Comput. Eng., Kyoto Univ., Kyoto, Japan
Abstract :
A design procedure for generating predictive MOS-FET models is proposed. Due to evolving nature of future prediction, predictive models based on a certain prediction soon become absolute. We have therefore developed a design procedure for maintaining compatibility with most up-to-date prediction such as ITRS. The design procedure can generate predictive RF models for the first time. Details of the design procedure for BSIM4 as a core model are explained, with an application to LNA design example.
Keywords :
MOSFET; semiconductor device models; BSIM4; ITRS; LNA design; predictive RF MOSFET model; Capacitance; Integrated circuit modeling; MOSFET circuits; Mathematical model; Predictive models; Radio frequency; Resistance;
Conference_Titel :
SOC Conference (SOCC), 2010 IEEE International
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-6682-5
DOI :
10.1109/SOCC.2010.5784704