Title :
An improved error correction method of TRL removing manufacturing inaccuracy
Author :
Kim, Yusin ; Lee, Chang-Seok
Abstract :
The TRL error correction method is mainly used when we measure a high frequency device fabricated on an MMIC substrate, but in order to correct error more precisely, we must understand the characteristic impedance of a standard transmission line fabricated for error correction. The previous method calculates the capacitance per unit length of transmission line by using additionally the standard of the transmission line where the resistor is terminated, and also the characteristic impedance of the standard transmission line by fitting it to a low frequency, but we ascertain a characteristic impedance extracted by a manufacturing inaccuracy is influenced. In this study we introduce a new method to reduce the manufacturing inaccuracy out of the measured results, and as a result, we can extract more accurate characteristic impedance than the previous method.
Keywords :
MMIC; electric impedance measurement; error correction; measurement errors; substrates; transmission line theory; MMIC substrate; TRL; characteristic impedance; error correction; high frequency device measurement; manufacturing inaccuracy; through reflect line method; transmission line; Capacitance; Error correction; Frequency measurement; Impedance measurement; MMICs; Manufacturing; Measurement standards; Resistors; Transmission line measurements; Transmission lines;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2004. IEEE
Print_ISBN :
0-7803-8302-8
DOI :
10.1109/APS.2004.1330131