DocumentCode
3384415
Title
New power rail ESD clamp design with current starving technology
Author
Li, Bo ; Wu, Lij I. ; Zhang, Xiangmin
Author_Institution
Inst. of Microelectron., Tsinghua Univ., Beijing, China
fYear
2011
fDate
25-28 Oct. 2011
Firstpage
961
Lastpage
964
Abstract
A new technique, introducing current starving into power rail ESD design, is presented and verified in this paper. To achieve the turn-on time requirement of the power rail ESD clamp circuit in a certain time, a smaller capacitor value will be permitted by which the current starving is used. Besides, PMOS keeper architecture is adopted in order to achieve low power leakage. Eventually, combining current starving technique with the PMOS keeper, the capacitor value is reduced by about one in ten.
Keywords
MOS integrated circuits; electrostatic discharge; network synthesis; PMOS keeper; current starving technology; electrostatic discharge; power leakage; power rail ESD clamp circuit design; turn-on time requirement; Clamps; Electrostatic discharges; Indexes; MOS devices; System-on-a-chip; Current starving; ESD; PMOS keeper; capacitor-small; low-leakage;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location
Xiamen
ISSN
2162-7541
Print_ISBN
978-1-61284-192-2
Electronic_ISBN
2162-7541
Type
conf
DOI
10.1109/ASICON.2011.6157366
Filename
6157366
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