• DocumentCode
    3384415
  • Title

    New power rail ESD clamp design with current starving technology

  • Author

    Li, Bo ; Wu, Lij I. ; Zhang, Xiangmin

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing, China
  • fYear
    2011
  • fDate
    25-28 Oct. 2011
  • Firstpage
    961
  • Lastpage
    964
  • Abstract
    A new technique, introducing current starving into power rail ESD design, is presented and verified in this paper. To achieve the turn-on time requirement of the power rail ESD clamp circuit in a certain time, a smaller capacitor value will be permitted by which the current starving is used. Besides, PMOS keeper architecture is adopted in order to achieve low power leakage. Eventually, combining current starving technique with the PMOS keeper, the capacitor value is reduced by about one in ten.
  • Keywords
    MOS integrated circuits; electrostatic discharge; network synthesis; PMOS keeper; current starving technology; electrostatic discharge; power leakage; power rail ESD clamp circuit design; turn-on time requirement; Clamps; Electrostatic discharges; Indexes; MOS devices; System-on-a-chip; Current starving; ESD; PMOS keeper; capacitor-small; low-leakage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2011 IEEE 9th International Conference on
  • Conference_Location
    Xiamen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-61284-192-2
  • Electronic_ISBN
    2162-7541
  • Type

    conf

  • DOI
    10.1109/ASICON.2011.6157366
  • Filename
    6157366