Title :
New power rail ESD clamp design with current starving technology
Author :
Li, Bo ; Wu, Lij I. ; Zhang, Xiangmin
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
A new technique, introducing current starving into power rail ESD design, is presented and verified in this paper. To achieve the turn-on time requirement of the power rail ESD clamp circuit in a certain time, a smaller capacitor value will be permitted by which the current starving is used. Besides, PMOS keeper architecture is adopted in order to achieve low power leakage. Eventually, combining current starving technique with the PMOS keeper, the capacitor value is reduced by about one in ten.
Keywords :
MOS integrated circuits; electrostatic discharge; network synthesis; PMOS keeper; current starving technology; electrostatic discharge; power leakage; power rail ESD clamp circuit design; turn-on time requirement; Clamps; Electrostatic discharges; Indexes; MOS devices; System-on-a-chip; Current starving; ESD; PMOS keeper; capacitor-small; low-leakage;
Conference_Titel :
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-61284-192-2
Electronic_ISBN :
2162-7541
DOI :
10.1109/ASICON.2011.6157366