DocumentCode :
3384568
Title :
Inaccuracies of input data relevant for PV yield prediction
Author :
Krauter, Stefan ; Grunow, Paul ; Preiss, Alexander ; Rindert, Soeren ; Ferretti, Nicoletta
Author_Institution :
Photovoltaik Institut Berlin AG, Einsteinufer 25, D-10587, Germany
fYear :
2008
fDate :
11-16 May 2008
Firstpage :
1
Lastpage :
5
Abstract :
Accuracy of the PV yield prediction process, including meteorological data (direct and diffuse irradiance with its actual spectral composition and spatial distribution), material properties of encapsulation (refractive indices, absorption coefficients, thermal properties), parameters relevant for heat transfer, PV conversion parameters of the cell (temperature coefficients, spectral response, weak light performance, degradation) considerably depends on the quality of the input data applied (derived from literature, data sheets, norms, software tools, or own measurements). The contribution gives an overview of the processes involved, the relevant parameters, the accuracy achievable and the impact on yield prediction.
Keywords :
Absorption; Accuracy; Encapsulation; Heat transfer; Material properties; Meteorology; Optical refraction; Temperature dependence; Temperature distribution; Thermal degradation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location :
San Diego, CA, USA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-1640-0
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2008.4922866
Filename :
4922866
Link To Document :
بازگشت