An Adaptive High Resolution Measuring System for Charcaterizing Transformers Subjected to Broadband Excitation

Several phenomena in transformers are best analyzed in the frequency domain when energized by broadband excitation. These include dielectric behavior to lightning impulse, winding deformation during transport and structural failure during short circuit tests. We propose an adaptive architecture that characterizes all these events in an unifying manner. The developed instrument is based on the PXI hardware with necessary software developed under LABVIEW environment. Experimental results using the developed instrument are reported to demonstrate its versatility.