Title :
Study on software reliability growth model
Author :
Qingtian, Han ; Wenjing, Cao ; Lian, Li ; Xiaoyan, Gao
Author_Institution :
Naval Aeronaut. & Astronaut. Univ., Yantai, China
Abstract :
The reliability growth models for software were studied. The MLE of the parameters for the exponential reliability growth model were given. The result shows that the Exponential model is useful for the data containing small samples. The model and the estimation method were applied to a data set. Compared with the Duane and AMSAA model, the estimators of the parameters and MTBF of ERGII has the precision to some extent. Furthermore, the model and the estimation of the parameters are applicable for small sample data.
Keywords :
exponential distribution; parameter estimation; software reliability; exponential reliability growth model; parameter estimation; software reliability; Aerospace industry; Application software; Computational intelligence; Computer industry; Fault detection; Hardware; Maximum likelihood estimation; Parameter estimation; Predictive models; Software reliability; parameter estimation; reliability growth; softeware reliability;
Conference_Titel :
Computational Intelligence and Industrial Applications, 2009. PACIIA 2009. Asia-Pacific Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4606-3
DOI :
10.1109/PACIIA.2009.5406460
