DocumentCode :
3384673
Title :
Dynamic power and thermal integrity in 3D integration
Author :
Yu, Hao ; He, Lei
Author_Institution :
Berkeley Design Autom., Santa Clara, CA, USA
fYear :
2009
fDate :
23-25 July 2009
Firstpage :
1108
Lastpage :
1112
Abstract :
This paper presents a state-of-art advance in 3D integrations. It illustrates the need for a high-performance 3D design driven by dynamic power and thermal integrity. The through-silicon-via (TSV) is used to simultaneously deliver power supply and remove heat. More importantly, to cope with the large-scale design complexity, the modern macromodeling technique is applied to handle not only large numbers of dynamic inputs/working-loads but also large sizes of RLC/RC networks distributing the power/heat. Experiments applying the 3D design presented by this paper showed promising results to reduce both runtime and resource.
Keywords :
RC circuits; RLC circuits; VLSI; integrated circuit design; thermal analysis; 3D integrated circuits; RC network; RLC network; VLSI integration; dynamic power integrity; high-performance 3D design; large-scale design complexity; macromodeling technique; thermal integrity; through-silicon-via technique; Dielectrics; Helium; Large-scale systems; Logic circuits; Packaging; Power supplies; Temperature; Thermal resistance; Through-silicon vias; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Circuits and Systems, 2009. ICCCAS 2009. International Conference on
Conference_Location :
Milpitas, CA
Print_ISBN :
978-1-4244-4886-9
Electronic_ISBN :
978-1-4244-4888-3
Type :
conf
DOI :
10.1109/ICCCAS.2009.5250320
Filename :
5250320
Link To Document :
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