• DocumentCode
    3384710
  • Title

    MgF2/BN double layer antireflection coating for photovoltaic application

  • Author

    Alemu, Andenet ; Freundlich, Alex ; Badi, Nacer ; Boney, Chris ; Bensaoula, Abdelhak

  • Author_Institution
    Photovoltaic and Nanostructures Laboratory, Center for Advanced Materials, University Of Houston, Texas 77204-5004, USA
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Modeling and fabrication of double layer MgF2/BN antireflection coatings have been undertaken. Minimal reflection losses (≪5%) over a wide range of the solar irradiance (1.1 to 3 eV) are realized for Si and GaAs. Dispersion (n,k) analyses of individual BN films using spectroscopic ellipsometry indicated a nearly constant index of refraction of ∼ 2.8 and a negligible transmission loss over the useful range of the solar spectrum (0.7 to 3.2 eV). This spectral stability in conjunction with its robust ceramic nature and its fairly wide bandgap (6.2 eV) makes BN thin film well adapted for integration in multi-junction and space solar cells.
  • Keywords
    Ceramics; Coatings; Ellipsometry; Fabrication; Gallium arsenide; Optical films; Propagation losses; Reflection; Robust stability; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922874
  • Filename
    4922874