Title :
Multi-cycle compress technique for high-speed IP in low-cost environment
Author :
Chen, Gong-Han ; Lin, Chu-Chuan ; Wu, Po-Han ; Rau, Jiann-Chyi
Author_Institution :
Dept. of Electr. Eng., Tamkang Univ., Tamsui, Taiwan
fDate :
May 30 2010-June 2 2010
Abstract :
We present a Linear Feedback Shift Register (LFSR) like architecture, because the LFSR can bring a lot of data by using a few bits. We calculate the ATE data by Gauss-Elimination and put the ATE data to our decompression architecture to generate a lot of patterns. And one ATE data will run several times in the architecture. If some faults cannot be detected, we will generate the patterns which are brought by fault simulation. If still a few faults cannot be detected, the faults will be caught by directly modify the bits of ATE data. The less ATE data we use, the less cycles we need. Because the reason, we can get high speed testing. And the less data, the low-cost environment we need. The cycle we can save is up to 61.60x. And the average rate of compression can get 19.33x.
Keywords :
automatic test pattern generation; data compression; fault simulation; integrated circuit testing; shift registers; ATE data calculation; Gauss elimination; LFSR; decompression architecture; fault simulation; high-speed IP; linear feedback shift register; multicycle compression technique; Circuit faults; Circuit testing; Counting circuits; Fault detection; Flip-flops; Gaussian processes; Linear feedback shift registers; Pins; Test data compression; Very large scale integration;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537677