• DocumentCode
    3384791
  • Title

    Customized wavelets for fault location in power systems

  • Author

    Argyropoulos, P.E. ; Lev-Ari, Hanoch

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
  • fYear
    2011
  • fDate
    4-6 Aug. 2011
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    A procedure for generating customized wavelets for detecting the location of a fault in a power transmission line is proposed. A typical fault waveform consists of a 60Hz component and multiple reflections of a short transient. Measuring the time-difference-of-arrival (TDOA) between two consecutive transient reflections provides an accurate estimate of the location of the fault. Highly accurate TDOA estimates can be obtained only when the processed fault waveform consists of short/peaked pulses. Our customization procedure enhances the "peakedness" of the transient waveform by optimizing a suitable peakedness metric. This approach yields more accurate estimates than the method used in [1], which used a standard (Daubechies-4) wavelet to process the fault waveform. Our analysis also provides us with some insight as to why a discrete wavelet transform (including the one used in [1]) can significantly enhance the peakedness of a wide variety of power system fault waveforms.
  • Keywords
    discrete wavelet transforms; power transmission faults; power transmission lines; time-of-arrival estimation; TDOA measurement; customized wavelets; discrete wavelet transform; fault location detection; fault waveform; frequency 60 Hz; power system fault waveforms; power transmission line; processed fault waveform; time-difference-of-arrival measurement; transient waveform; Cost function; Filter banks; Lattices; Transient analysis; Wavelet transforms; Customized Wavelets; Fault Location; Power System Faults; Waveform Peakedness; Waveform Sharpness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    North American Power Symposium (NAPS), 2011
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4577-0417-8
  • Electronic_ISBN
    978-1-4577-0418-5
  • Type

    conf

  • DOI
    10.1109/NAPS.2011.6024881
  • Filename
    6024881