DocumentCode :
3384882
Title :
Simulation of discharge development in SF6 and SF6 -mixtures for homogeneous and inhomogeneous field distribution
Author :
Pfeiffer, W. ; Welke, H.
Author_Institution :
Tech. Hochschule, Darmstadt, Germany
fYear :
1992
fDate :
7-10 Jun 1992
Firstpage :
336
Lastpage :
339
Abstract :
A model has been developed for the simulation of electrical breakdown phenomena in compressed gaseous dielectrics taking into account electron-neutral-gas collisions and collective interactions among charged particles. Elastic, exciting, ionizing and attaching collisions between electrons and neutral gas molecules are included using a Monte Carlo technique. Space charge effects are considered by solving Poisson´s equation for one dimension and two dimensions. A method is presented for simulating the predischarge development in multicomponent gas mixtures. Using this model, it is possible to analyze the effect of corona stabilization under impulse voltage stress. The ionization and attachment coefficients are determined by directly solving the Boltzmann equation
Keywords :
Monte Carlo methods; corona; electric breakdown of gases; electron attachment; gas mixtures; gaseous insulation; ionisation of gases; molecular electron impact ionisation; sulphur compounds; transients; Boltzmann equation; Monte Carlo technique; Poisson´s equation; SF6; attaching collisions; collective interactions; compressed gaseous dielectrics; discharge development; effect of corona stabilization; elastic collisions; electrical breakdown phenomena; electron-neutral-gas collisions; exciting collisions; homogeneous field distribution; impulse voltage stress; inhomogeneous field distribution; ionizing collisions; model; multicomponent gas mixtures; predischarge development; simulation; space charge effects; Corona; Dielectric breakdown; Electric breakdown; Electrons; Joining processes; Monte Carlo methods; Poisson equations; Space charge; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, Conference Record of the 1992 IEEE International Symposium on
Conference_Location :
Baltimore, MD
ISSN :
1089-084X
Print_ISBN :
0-7803-0649-X
Type :
conf
DOI :
10.1109/ELINSL.1992.246987
Filename :
246987
Link To Document :
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