DocumentCode :
3384941
Title :
SF6 breakdown characteristics with a specially-designed cathode
Author :
Fréchette, Michel F.
Author_Institution :
Hydro-Quebec, Varennes, Que., Canada
fYear :
1992
fDate :
7-10 Jun 1992
Firstpage :
320
Lastpage :
323
Abstract :
A high-voltage photocathode design recently introduced for breakdown studies in compressed-gas and high-field conditions is used in a study of SF6. The experiment was carried out for N×d ranging from 0.25 to 3.3×1019 cm-2, N and d being, respectively, the molecular density and gap length. Statistical scattering of data was low, on average within 2 and 3%, respectively, for uniform and nonuniform conditions. Measured breakdown values were found to fall into two categories, Paschen and non-Paschen data, depending on the parametric couple (N,d) considered. Paschen data are in full agreement with values calculated using a streamer breakdown criterion. Local nonuniformity produced by the device seems to affect the Paschen behavior slightly at very short gap length and higher densities. Departure from the Paschen curve and growing deviation as N×d increases characterize the other category. The couples (Ns, ds) at which departures set in are determined by numerically fitting the data. When displayed assuming a linear relationship, experimental ds scales inversely with its corresponding Ns, illustrating the highly consistent behavior of the active deviation mechanisms, particularly in relation to reproducibility
Keywords :
electric breakdown of gases; gaseous insulation; high-voltage techniques; insulation testing; photocathodes; sulphur compounds; Paschen data; SF6; breakdown studies; compressed-gas; gaseous insulation; high-field conditions; high-voltage photocathode design; local nonuniformity effect; non-Paschen data; streamer breakdown criterion; Cathodes; Contacts; Electric breakdown; Electrodes; Electron guns; Geometry; Gold; Insulation; Production; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, Conference Record of the 1992 IEEE International Symposium on
Conference_Location :
Baltimore, MD
ISSN :
1089-084X
Print_ISBN :
0-7803-0649-X
Type :
conf
DOI :
10.1109/ELINSL.1992.246991
Filename :
246991
Link To Document :
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