DocumentCode :
3385018
Title :
Evaluation of conducted EMI measurement without LISN using two-port ABCD network approach for EMI filter design under real operating condition
Author :
Kang-Rong Li ; Kye-Yak See
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2015
fDate :
26-29 May 2015
Firstpage :
632
Lastpage :
635
Abstract :
To demonstrate the impact of the line impedance stabilization network (LISN) on conducted electromagnetic interference (EMI) measurement, an in-circuit impedance extraction method based on inductive coupling approach is developed to extract the common mode (CM) and the differential mode (DM) noise impedances of AC mains, LISN, and switched-mode power supply (SMPS) under operating condition. By treating two inductive coupling probes and the device-under-test (DUT) for impedance extraction as three cascaded two-port ABCD networks, the CM and DM noise impedances can be extracted with ease. The extracted CM/DM noise impedance of AC mains is compared with the extracted SMPS and LISN CM/DM noise impedances, respectively. By analyzing the impedance comparisons, the impact of LISN on conducted EMI measurement for EMI filter design under real operating condition is evaluated. Finally, the evaluation is validated with the conducted EMI currents measured with and without LISN.
Keywords :
electromagnetic interference; filters; switched mode power supplies; CM noise impedances; DM noise impedances; DUT; EMI currents; EMI filter design; EMI measurement; LISN; SMPS; cascaded two-port ABCD networks; common mode noise impedances; device-under-test; differential mode noise impedances; electromagnetic interference; in-circuit impedance extraction method; inductive coupling probes; line impedance stabilization network; switched-mode power supply; Current measurement; Electromagnetic interference; Impedance; Impedance measurement; Noise; Probes; Switched-mode power supply; LISN; common mode (CM); conducted EMI; differential mode (DM); in-circuit impedance extraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
Type :
conf
DOI :
10.1109/APEMC.2015.7175407
Filename :
7175407
Link To Document :
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