• DocumentCode
    3385018
  • Title

    Evaluation of conducted EMI measurement without LISN using two-port ABCD network approach for EMI filter design under real operating condition

  • Author

    Kang-Rong Li ; Kye-Yak See

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    632
  • Lastpage
    635
  • Abstract
    To demonstrate the impact of the line impedance stabilization network (LISN) on conducted electromagnetic interference (EMI) measurement, an in-circuit impedance extraction method based on inductive coupling approach is developed to extract the common mode (CM) and the differential mode (DM) noise impedances of AC mains, LISN, and switched-mode power supply (SMPS) under operating condition. By treating two inductive coupling probes and the device-under-test (DUT) for impedance extraction as three cascaded two-port ABCD networks, the CM and DM noise impedances can be extracted with ease. The extracted CM/DM noise impedance of AC mains is compared with the extracted SMPS and LISN CM/DM noise impedances, respectively. By analyzing the impedance comparisons, the impact of LISN on conducted EMI measurement for EMI filter design under real operating condition is evaluated. Finally, the evaluation is validated with the conducted EMI currents measured with and without LISN.
  • Keywords
    electromagnetic interference; filters; switched mode power supplies; CM noise impedances; DM noise impedances; DUT; EMI currents; EMI filter design; EMI measurement; LISN; SMPS; cascaded two-port ABCD networks; common mode noise impedances; device-under-test; differential mode noise impedances; electromagnetic interference; in-circuit impedance extraction method; inductive coupling probes; line impedance stabilization network; switched-mode power supply; Current measurement; Electromagnetic interference; Impedance; Impedance measurement; Noise; Probes; Switched-mode power supply; LISN; common mode (CM); conducted EMI; differential mode (DM); in-circuit impedance extraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4799-6668-4
  • Type

    conf

  • DOI
    10.1109/APEMC.2015.7175407
  • Filename
    7175407