DocumentCode
3385018
Title
Evaluation of conducted EMI measurement without LISN using two-port ABCD network approach for EMI filter design under real operating condition
Author
Kang-Rong Li ; Kye-Yak See
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2015
fDate
26-29 May 2015
Firstpage
632
Lastpage
635
Abstract
To demonstrate the impact of the line impedance stabilization network (LISN) on conducted electromagnetic interference (EMI) measurement, an in-circuit impedance extraction method based on inductive coupling approach is developed to extract the common mode (CM) and the differential mode (DM) noise impedances of AC mains, LISN, and switched-mode power supply (SMPS) under operating condition. By treating two inductive coupling probes and the device-under-test (DUT) for impedance extraction as three cascaded two-port ABCD networks, the CM and DM noise impedances can be extracted with ease. The extracted CM/DM noise impedance of AC mains is compared with the extracted SMPS and LISN CM/DM noise impedances, respectively. By analyzing the impedance comparisons, the impact of LISN on conducted EMI measurement for EMI filter design under real operating condition is evaluated. Finally, the evaluation is validated with the conducted EMI currents measured with and without LISN.
Keywords
electromagnetic interference; filters; switched mode power supplies; CM noise impedances; DM noise impedances; DUT; EMI currents; EMI filter design; EMI measurement; LISN; SMPS; cascaded two-port ABCD networks; common mode noise impedances; device-under-test; differential mode noise impedances; electromagnetic interference; in-circuit impedance extraction method; inductive coupling probes; line impedance stabilization network; switched-mode power supply; Current measurement; Electromagnetic interference; Impedance; Impedance measurement; Noise; Probes; Switched-mode power supply; LISN; common mode (CM); conducted EMI; differential mode (DM); in-circuit impedance extraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location
Taipei
Print_ISBN
978-1-4799-6668-4
Type
conf
DOI
10.1109/APEMC.2015.7175407
Filename
7175407
Link To Document