• DocumentCode
    3385496
  • Title

    Impacts of signal slew and skew variations on delay uncertainty and crosstalk noise in coupled RLC global interconnects

  • Author

    Roy, Abinash ; Xu, Jingye ; Chowdhury, Masud H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Chicago, Chicago, IL
  • fYear
    2008
  • fDate
    Aug. 31 2008-Sept. 3 2008
  • Firstpage
    1055
  • Lastpage
    1058
  • Abstract
    This paper addresses the impacts of signal slew time and signal skew variations on delay uncertainty and cross talk noise in coupled inductive lines for different switching patterns. Our findings reveal that delay variation in a victim line always increases with the reduction of signal slew time and increase in signal skew. We also observe that cross talk noise reduces with increasing signal skew, and the impacts of skew variation on cross talk noise is more prominent for lines with strong capacitive coupling. Here, equivalent circuit model parameters have been extracted using FastCap and FastHenry field solvers, and results have been obtained by HSpice simulation.
  • Keywords
    RLC circuits; SPICE; crosstalk; integrated circuit interconnections; FastCap; FastHenry field solvers; HSpice simulation; coupled RLC global interconnects; crosstalk noise; delay uncertainty; equivalent circuit model parameters; signal slew-skew variations; CMOS technology; Capacitance; Circuit simulation; Coupling circuits; Crosstalk; Delay effects; Inductance; Integrated circuit interconnections; Propagation delay; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on
  • Conference_Location
    St. Julien´s
  • Print_ISBN
    978-1-4244-2181-7
  • Electronic_ISBN
    978-1-4244-2182-4
  • Type

    conf

  • DOI
    10.1109/ICECS.2008.4675038
  • Filename
    4675038