Smooth awakenings: Reactivation noise suppressed low-leakage and robust MTCMOS flip-flops

Author

Jiao, Hailong ; Kursun, Volkan

Author_Institution

Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China

fYear

2010

fDate

May 30 2010-June 2 2010

Firstpage

3845

Lastpage

3848

Abstract

Ground bouncing noise produced during the sleep to active mode transitions is an important reliability concern in multi-domain Multi-Threshold CMOS (MTCMOS) integrated circuits. Ground bouncing noise, leakage power consumption, and data stability of MTCMOS flip-flops are evaluated in this paper. The effectiveness of different circuit techniques is discussed for achieving lower noise during the reactivation events while maintaining robust and low-leakage data retention capability in MTCMOS flip-flops.

Keywords

CMOS logic circuits; flip-flops; integrated circuit reliability; low-power electronics; data stability; ground bouncing noise; leakage power consumption; low-leakage data retention capability; reactivation noise suppressed low-leakage flip-flops; reliability concern; robust MTCMOS flip-flops; smooth awakenings; Active noise reduction; Circuit noise; Circuit stability; Energy consumption; Flip-flops; Integrated circuit noise; Integrated circuit reliability; Latches; Noise robustness; Random access memory;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on

Conference_Location

Paris

Print_ISBN

978-1-4244-5308-5

Electronic_ISBN

978-1-4244-5309-2

Type

conf

DOI

10.1109/ISCAS.2010.5537716

Filename

5537716