Title :
The refractive index of InP and its temperature dependence in the wavelength range from 1.2 μm to 1.6 μm
Author :
Gini, Emilio ; Melchior, Hans
Author_Institution :
Inst. for Quantum Electron., Swiss Federal Inst. of Technol., Zurich, Switzerland
Abstract :
Measurements of the refractive index of InP in the wavelength range from 1.2 μm to 1.6 μm have been carried out with a relative accuracy of 2×10-4. The refractive indices are determined from the measured transmission wavelengths of an n-/n+-InP demultiplexer and their temperature dependence. The refractive indices are found to vary linearly with temperature with a coefficient between 2.3 and 1.9×10-4/K. The results are compared with data from literature
Keywords :
III-V semiconductors; demultiplexing; indium compounds; integrated optics; light transmission; optical materials; refractive index; 1.2 to 1.6 mum; InP; integrated optical demultiplexer; n-/n+-InP demultiplexer; refractive index; temperature dependence; transmission wavelengths; Gratings; Indium phosphide; Optical devices; Optical fiber polarization; Optical refraction; Optical variables control; Optical waveguides; Refractive index; Temperature dependence; Wavelength measurement;
Conference_Titel :
Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on
Conference_Location :
Schwabisch-Gmund
Print_ISBN :
0-7803-3283-0
DOI :
10.1109/ICIPRM.1996.492318
